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| metrology News+ XML/RSSBy Tamar Technology Tamar Technology received an order for its WaferScan metrology system from a major semiconductor manufacturer. The system will be used for 3DIC packaging and process development. By Sharon Bentzley Laboratory Testing Inc. received an Honorable Mention from the Philadelphia 100 annual program recognizing the fastest growing, privately-held companies in the Greater Philadelphia Region. By Vision Engineering Ltd Swift is one of the most intuitive, easy to use video measuring systems available. Designed as a powerful, yet simple video measuring system, Swift provides fast and accurate measurement of both routine and complex precision component parts. By Cal Lab Company In addition to their ISO/IEC 17025 accreditation, Cal Lab Company is accredited to ANSI/NCSL Z540.3, through L-A-B's Metrology and Calibration Accreditation Program (METCAP). All Press ReleasesBy Tamar Technology Tamar Technology received an order for its WaferScan metrology system from a major semiconductor manufacturer. The system will be used for 3DIC packaging and process development. By Sharon Bentzley Laboratory Testing Inc. received an Honorable Mention from the Philadelphia 100 annual program recognizing the fastest growing, privately-held companies in the Greater Philadelphia Region. By Vision Engineering Ltd Swift is one of the most intuitive, easy to use video measuring systems available. Designed as a powerful, yet simple video measuring system, Swift provides fast and accurate measurement of both routine and complex precision component parts. Frost&Sullivan: Constantly Evolving Technologies Require Advanced and Easy-to-Use Metrology Software By Frost & Sullivan The global market is expected to escalate from $254.4 million of 2009 up to $331.9 million in 2014 – Expansive Product Portfolio Will Help Metrology Software Vendors Stave off Competition By Sharon Bentzley Electrical calibration, temperature calibration and uniformity surveys are A2LA accredited when performed by LTI Metrology. All calibration services are NIST-traceable and uniformity surveys are performed according to AMS2750D requirements. By Prime Management Services Experience with small international associations key to decision. By CRAIC Technologies The 308 PV™ spectrophotometer is designed for colorimetry and spectroscopy of even sub-micron-sized features. It attaches to a microscope or probe station to yield spectra and colorimetric data quickly and easily. By Cal Lab Company In addition to their ISO/IEC 17025 accreditation, Cal Lab Company is accredited to ANSI/NCSL Z540.3, through L-A-B's Metrology and Calibration Accreditation Program (METCAP). By Sunrise Optical LLC Sunrise Optical LLC: Liquid samples including drops and splatters can be easily measured using our new Portable Model P-1PORT Zebra OptoProfiler. Drops and splatters can be measured on vertical, inclined or horizontal surfaces. Colorimetry and Intensity Mapping of Large Displays With Microscopic Spatial Resolution-A Novel Solu By CRAIC Technologies, Inc. The 20/20 XL™ is able to take spectra and images of microscopic features of large flat panel displays. The 20/20 XL™ can measure color and intensity of even individual pixels of even the biggest displays.. By Sonardyne International Ltd Survey teams from SapuraAcergy and TL Geohydrographics, recently found themselves with time on their hands. By Vision Engineering Ltd Powerful, yet simple and intuitive, delivering accurate results with confidence, the Falcon incorporates an automated measurement option, making the measurement process effortless, and automatically, saving time. By BFi OPTiLAS international BFi OPTiLAS, is very proud to introduce an integrated kHz tunable DPSS laser system developed by Ekspla. By George Products George Products Company, Inc. has announced the addition of Florida Metrology as the newest distributor of its OASIS Inspection Systems. By CRAIC Technologies The 308 PV™ from CRAIC Technologies is able to determine the color coordinates of microscopic features quickly and easily. By CRAIC Technologies The 308 FPD™ from CRAIC Technologies is able to measure the colorimetry and intensities of single pixels within the smallest displays. By University of Waikato Industrial Research Ltd head metrologist Rod White will receive a Doctor of Science degree at Waikato University’s graduation ceremony this week. By Ellison Technologies Ellison Technologies Announces Exclusive Distributorship Agreement with Carl Zeiss Industrial Metrology for Illinois, Iowa, Nebraska and Eastern Missouri By NeoMetrix Technologies, Inc. CMM’s have long been considered the standard for 3D measurement. However their lack of portability has always hindered their usefulness outside the QC Department. The new HandyProbe takes the CMM out of the lab and onto the manufacturing floor. By GKS Global Services The metrology services provider now completes 150 successful projects per month on average By CRAIC Technologies The 20/20 FPD is a microspectrophotometer for metrology of flat panel displays by colorimetry and relative intensity measurements. Testing can be done within pixels, pixel to pixel or even of groups of pixels. By Aven, Inc. Microscopy photos and white papers with tips on instrument selection and use are part of the social media initiative. Fans can post photos or albums. An iPod giveaway is an incentive to join Aven, Inc. on Facebook. By CRAIC Technologies The QDI 2010 Film microspectrophotometer is a system designed to measure transmissivity, reflectivity, and the thickness of thin films used for precision manufacture of photovoltaic cells. By Keithley Instruments, Inc. The Metrology Services organization at Keithley Instruments, Inc. (NYSE: KEI) has expanded the scope of its ISO 17025 accreditation with the American Association for Laboratory Accreditation (A2LA). By Vision Engineering Ltd With over 50 years of proven optical experience, Vision Engineering has packed massive technical capabilities into the new Falcon 3-axis non-contact video measuring system. By Micro Precision Automation With state of the art features for the next generation of semiconductor manufacturing, a 450mm wafer metrology stage will be shown at SEMICON West this week.. By Electronic Development Laboratories, Inc. EDL announces the release of the innovative MSB-500, which provides an affordable, safe, and effective alternative to the traditional larger floor style baths. Remarkable 10 mK stabilities and uniformity is achieved using less than 14 lbs of salt! By Danielle K. Polsky EDL introduces the T-VALH; a small portable field calibrator that simplifies on-site calibration of the most hard to reach immersion or insertion sensors. By Joel Ellazar, Marketing Specialist Three of Advanced Test Equipment’s lab technicians have achieved Certified Calibration Technician (CCT) status from ASQ (American Society for Quality). By Danielle K. Polsky EDL introduces the new Megaohm Validator®, a product that guarantees the measurement accuracy of insulation resistance testers crucial to trust in measurement. By Sharon Bentzley/Laboratory Testing Inc. The PA materials testing and calibration services company, Laboratory Testing Inc., announced the promotions of Eva Pellow to Metrology Manager and Ed Phillips to Metrology Supervisor. By ACT Denver ACT's Denver, CO lab has added new capacity with three new high-accuracy systems. By ACT Denver ACT, is pleased to announce that we have expanded our relationship with Mahr Federal. ACT is now the exclusive representative in Arizona for the complete line of Mahr Federal Surface, Contour, and Form measurement equipment. By Sharon Bentzley/Laboratory Testing Inc. LTI Metrology has added new equipment, Federal B-3 Comparator, Beta LaserMike and Mahr Federal Gage Block Comparator, to improve its calibration capabilities and accuracy. Page:
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